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N. Galbiati

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2000 – 2009

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2005
[j2]
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G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, Andrea Ghetti, N. Galbiati, G. Giusto, A. Garavaglia:
Impact of interface and bulk trapped charges on transistor reliability. Microelectron. Reliab. 45(5-6): 857-860 (2005)
2001
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N. Galbiati, G. Ghidini, C. Cremonesi, Luca Larcher:
Impact of the As dose in 0.35 mum EEPROM technology: characterization and modeling. Microelectron. Reliab. 41(7): 999-1002 (2001)

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