"Impact of interface and bulk trapped charges on transistor reliability."

G. Ghidini et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.11.031

access: closed

type: Journal Article

metadata version: 2022-10-02

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G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, Andrea Ghetti, N. Galbiati, G. Giusto, A. Garavaglia:
Impact of interface and bulk trapped charges on transistor reliability. Microelectron. Reliab. 45(5-6): 857-860 (2005)

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