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D. Brazzelli

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2000 – 2009

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2005
[j3]
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G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, Andrea Ghetti, N. Galbiati, G. Giusto, A. Garavaglia:
Impact of interface and bulk trapped charges on transistor reliability. Microelectron. Reliab. 45(5-6): 857-860 (2005)
2003
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Andrea Ghetti, D. Brazzelli, A. Benvenuti, G. Ghidini, Alessia Pavan:
Anomalous gate oxide conduction on isolation edges: analysis and process optimization. Microelectron. Reliab. 43(8): 1229-1235 (2003)
2002
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G. Ghidini, D. Brazzelli:
Evaluation methodology of thin dielectrics for non-volatile memory application. Microelectron. Reliab. 42(9-11): 1473-1480 (2002)

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