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Wolfgang Nüchter

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2000 – 2009

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2007
[j2]
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  - journals/mr/SpraulNMWM07
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M. Spraul, Wolfgang Nüchter, A. Möller, Bernhard Wunderle, Bernd Michel:
Reliability of SnPb and Pb-free flip-chips under different test conditions. Microelectron. Reliab. 47(2-3): 252-258 (2007)
2004
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Bernhard Wunderle, Wolfgang Nüchter, Andreas Schubert, Bernd Michel, Herbert Reichl:
Parametric FE-approach to flip-chip reliability under various loading conditions. Microelectron. Reliab. 44(12): 1933-1945 (2004)

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