"Parametric FE-approach to flip-chip reliability under various loading ..."

Bernhard Wunderle et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.04.021

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type: Journal Article

metadata version: 2023-09-30

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Bernhard Wunderle, Wolfgang Nüchter, Andreas Schubert, Bernd Michel, Herbert Reichl:
Parametric FE-approach to flip-chip reliability under various loading conditions. Microelectron. Reliab. 44(12): 1933-1945 (2004)

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