"Reliability of SnPb and Pb-free flip-chips under different test conditions."

M. Spraul et al. (2007)

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DOI: 10.1016/J.MICROREL.2006.09.026

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type: Journal Article

metadata version: 2023-09-30

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M. Spraul, Wolfgang Nüchter, A. Möller, Bernhard Wunderle, Bernd Michel:
Reliability of SnPb and Pb-free flip-chips under different test conditions. Microelectron. Reliab. 47(2-3): 252-258 (2007)

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