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IBM Journal of Research and Development, Volume 28, 1984
Please be aware that the table of contents given here is incomplete.
Volume 28, Number 1, January 1984
- Edward N. Adams:
Optimizing Preventive Service of Software Products. 2-14 - Nancy R. Hall, Stanley Preiser:
Combined Network Complexity Measures. 15-27 - John F. Sowa:
Interactive Language Implementation System. 28-39 - Frederic N. Ris:
Experience with Access Functions in an Experimental Compiler. 40-51 - Robert Strom, Nagui Halim:
A New Programming Methodology for Long-Lived Software Systems. 52-59 - Cyril N. Alberga, Allen L. Brown, George B. Leeman Jr., Martin Mikelsons, Mark N. Wegman:
A Program Development Tool. 60-73 - Vincent J. Kruskal:
Managing Multi-Version Programs with an Editor. 74-81 - Marco A. Casanova, Jose E. Amaral de Sa:
Mapping Uninterpreted Schemes into Entity-Relationship Diagrams: Two Applications to Conceptual Schema Design. 82-94 - Ambuj Goyal, Tilak Agerwala:
Performance Analysis of Future Shared Storage Systems. 95-108
Volume 28, Number 2, March 1984
- Chin-Long Chen, M. Y. (Ben) Hsiao:
Error-Correcting Codes for Semiconductor Memory Applications: A State-of-the-Art Review. 124-134 - Glen G. Langdon Jr.:
An Introduction to Arithmetic Coding. 135-149 - Richard E. Blahut:
A Universal Reed-Solomon Decoder. 150-158 - Jean Arlat, William C. Carter:
Implementation and Evaluation of a (b, k)-Adjacent Error-Correcting/Detecting Scheme for Supercomputer Systems. 159-169 - Douglas C. Bossen, Chin-Long Chen, M. Y. (Ben) Hsiao:
Fault Alignment Exclusion for Memory Using Address Permutation. 170-176 - F. J. Aichelmann Jr.:
Fault-Tolerant Design Techniques for Semiconductor Memory Applications. 177-183 - C. L. Chen, Robert A. Rutledge:
Fault-Tolerant Memory Simulator. 184-195 - Marvin R. Libson, Harold E. Harvey:
A General-Purpose Memory Reliability Simulator. 196-205 - Thomas D. Howell:
Analysis of Correctable Errors in the IBM 3380 Disk File. 206-211 - Donald T. Tang, C. L. Chen:
Iterative Exhaustive Pattern Generation for Logic Testing. 212-219
Volume 28, Number 4, July 1984
- David R. Tryon, Fred M. Armstrong, Mark R. Reiter:
Statistical Failure Analysis of System Timing. 340-355 - Michael J. Flynn, Lee W. Hoevel:
Measures of Ideal Execution Architectures. 356-369 - Anthony Correale:
Design Considerations of a Static LSSD Polarity Hold Latch Pair. 370-378 - Richard E. Matick, Daniel T. Ling, Satish Gupta, Frederick Dill:
All Points Addressable Raster Display Memory. 379-392 - Daniel L. Ostapko:
A Mapping and Memory Chip Hardware which Provides Symmetric Reading/Writing of Horizontal and Vertical Lines. 393-398 - Jitendra V. Dave, Jenö Gazdag:
Reduction of Random Noise from Multiband Image Data Using Phase Relationships Among Their Fourier Coefficients. 399-411 - Donald L. Orth:
Empty Arrays in Extended APL. 412-427 - Mitsuru Ohba:
Software Reliability Analysis Models. 428-443 - Emil Hopner, Michael Allen Patten:
The Digital Data Exchange - A Space-Division Switching System. 444-453 - Sherri J. Gillespie:
Resist Profile Control in E-Beam Lithography. 454-460 - Charles H. Stapper:
Modeling of Defects in Integrated Circuit Photolithographic Patterns. 461-475 - Michael Held, Alan J. Hoffman, Ellis Lane Johnson, Philip Wolfe:
Aspects of the Traveling Salesman Problem. 476-486
Volume 28, Number 5, September 1984
- Richard L. Taylor:
A Software Architecture for a Mature Design Automation System. 501-512 - Ronald B. Capelli, George C. Sax:
A Device-Independent Graphics Package for CAD Applications. 512-523 - Walter H. Elder, Peter P. Zenewicz, Rita R. Alvarodiaz:
An Interactive System for VLSI Chip Physical Design. 524-537 - John A. Darringer, Daniel Brand, John V. Gerbi, William H. Joyner Jr., Louise Trevillyan:
LSS: A System for Production Logic Synthesis. 537-545 - James L. Gilkinson, Steven D. Lewis, Bruce B. Winter, Amir Hekmatpour:
Automated Technology Mapping. 546-556 - Leon I. Maissel, Hillel Ofek:
Hardware Design and Description Languages in IBM. 557-563 - Zeev Barzilai, Daniel K. Beece, Leendert M. Huisman, Gabriel M. Silberman:
Using a Hardware Simulation Engine for Custom MOS Structured Designs. 564-571 - Rolf-Dieter Fiebrich, Yuh-Zen Liao, George M. Koppelman, Edward N. Adams:
PSI: A Symbolic Layout System. 572-580 - Peter W. Cook:
Constraint Solver for Generalized IC Layout. 581-589 - A. M. Barone, J. K. Morrell:
Custom Chip/Card Design System. 590-595 - Peter S. Hauge, Ellen J. Yoffa:
ACORN: A System for CVS Macro Design by Tree Placement and Tree Customization. 596-602 - Peter C. Elmendorf:
KWIRE: A Multiple-Technology, User-Reconfigurable Wiring Tool for VLSI. 603-612 - Ralph Linsker:
An Iterative-Improvement Penalty-Function-Driven Wire Routing System. 613-624 - D. Leet, P. Shearon, R. France:
A CMOS LSSD Test Generation System. 625-635 - Charles H. Stapper:
Yield Model for Fault Clusters Within Integrated Circuits. 636-640
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