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Publication search results
found 82 matches
- 2018
- Sheis Abolma'ali, Mehdi Kamal, Ali Afzali-Kusha, Massoud Pedram:
An Efficient False Path-Aware Heuristic Critical Path Selection Method with High Coverage of the Process Variation Space. ACM Trans. Design Autom. Electr. Syst. 23(3): 32:1-32:25 (2018) - Ziad Abuowaimer, Dani Maarouf
, Timothy Martin, Jérémy Foxcroft, Gary Gréwal, Shawki Areibi, Anthony Vannelli:
GPlace3.0: Routability-Driven Analytic Placer for UltraScale FPGA Architectures. ACM Trans. Design Autom. Electr. Syst. 23(5): 66:1-66:33 (2018) - Luis Fernando Arcaro, Karila Palma Silva, Rômulo Silva de Oliveira:
On the Reliability and Tightness of GP and Exponential Models for Probabilistic WCET Estimation. ACM Trans. Design Autom. Electr. Syst. 23(3): 39:1-39:27 (2018) - Jalil Boukhobza, Stéphane Rubini, Renhai Chen, Zili Shao:
Emerging NVM: A Survey on Architectural Integration and Research Challenges. ACM Trans. Design Autom. Electr. Syst. 23(2): 14:1-14:32 (2018) - Burçin Çakir, Sharad Malik:
Reverse Engineering Digital ICs through Geometric Embedding of Circuit Graphs. ACM Trans. Design Autom. Electr. Syst. 23(4): 50:1-50:19 (2018) - Doohwang Chang, Ganapati Bhat, Ümit Y. Ogras, Bertan Bakkaloglu, Sule Ozev:
Detection Mechanisms for Unauthorized Wireless Transmissions. ACM Trans. Design Autom. Electr. Syst. 23(6): 70:1-70:21 (2018) - Yung-Chih Chen:
Enhancements to SAT Attack: Speedup and Breaking Cyclic Logic Encryption. ACM Trans. Design Autom. Electr. Syst. 23(4): 52:1-52:25 (2018) - Tseng-Yi Chen, Yuan-Hao Chang, Yuan-Hung Kuan, Ming-Chang Yang, Yu-Ming Chang, Pi-Cheng Hsiu:
Enhancing Flash Memory Reliability by Jointly Considering Write-back Pattern and Block Endurance. ACM Trans. Design Autom. Electr. Syst. 23(5): 64:1-64:24 (2018) - Abhimanyu Chopra, Hakan Aydin, Setareh Rafatirad, Houman Homayoun:
Optimal Allocation of Computation and Communication in an IoT Network. ACM Trans. Design Autom. Electr. Syst. 23(6): 78:1-78:22 (2018) - Chris Chu, Mustafa Ozdal:
Introduction to the Special Section on Advances in Physical Design Automation. ACM Trans. Design Autom. Electr. Syst. 23(4): 41:1-41:2 (2018) - Siad Daboul, Stephan Held, Jens Vygen, Sonja Wittke:
An Approximation Algorithm for Threshold Voltage Optimization. ACM Trans. Design Autom. Electr. Syst. 23(6): 68:1-68:16 (2018) - Nima Karimpour Darav, Ismail S. Bustany, Andrew A. Kennings, David T. Westwick, Laleh Behjat:
Eh?Legalizer: A High Performance Standard-Cell Legalizer Observing Technology Constraints. ACM Trans. Design Autom. Electr. Syst. 23(4): 43:1-43:25 (2018) - Lorenzo Delledonne, Vittorio Zaccaria, Ruggero Susella, Guido Bertoni, Filippo Melzani:
CASCA: A Design Automation Approach for Designing Hardware Countermeasures Against Side-Channel Attacks. ACM Trans. Design Autom. Electr. Syst. 23(6): 69:1-69:17 (2018) - Xuan Dong, Lihong Zhang:
PV-Aware Analog Sizing for Robust Analog Layout Retargeting with Optical Proximity Correction. ACM Trans. Design Autom. Electr. Syst. 23(6): 71:1-71:19 (2018) - Eman M. Elmandouh, Amr G. Wassal:
Guiding Formal Verification Orchestration Using Machine Learning Methods. ACM Trans. Design Autom. Electr. Syst. 23(5): 62:1-62:33 (2018) - Andreas Emeretlis, George Theodoridis, Panayiotis Alefragis, Nikos S. Voros:
Static Mapping of Applications on Heterogeneous Multi-Core Platforms Combining Logic-Based Benders Decomposition with Integer Linear Programming. ACM Trans. Design Autom. Electr. Syst. 23(2): 26:1-26:24 (2018) - Fatemeh Eslami, Steven J. E. Wilton:
Rapid Triggering Capability Using an Adaptive Overlay during FPGA Debug. ACM Trans. Design Autom. Electr. Syst. 23(6): 72:1-72:25 (2018) - Ramin Fallahzadeh, Hassan Ghasemzadeh:
Trading Off Power Consumption and Prediction Performance in Wearable Motion Sensors: An Optimal and Real-Time Approach. ACM Trans. Design Autom. Electr. Syst. 23(5): 67:1-67:23 (2018) - Congming Gao, Liang Shi, Yejia Di, Qiao Li, Chun Jason Xue, Kaijie Wu, Edwin Hsing-Mean Sha:
Exploiting Chip Idleness for Minimizing Garbage Collection - Induced Chip Access Conflict on SSDs. ACM Trans. Design Autom. Electr. Syst. 23(2): 15:1-15:29 (2018) - Andres F. Gomez, Víctor H. Champac:
Selection of Critical Paths for Reliable Frequency Scaling under BTI-Aging Considering Workload Uncertainty and Process Variations Effects. ACM Trans. Design Autom. Electr. Syst. 23(3): 27:1-27:21 (2018) - Inhak Han, Youngsoo Shin:
Folded Circuit Synthesis: Min-Area Logic Synthesis Using Dual-Edge-Triggered Flip-Flops. ACM Trans. Design Autom. Electr. Syst. 23(5): 61:1-61:21 (2018) - Sheng-Min Huang, Li-Pin Chang:
Providing SLO Compliance on NVMe SSDs Through Parallelism Reservation. ACM Trans. Design Autom. Electr. Syst. 23(3): 28:1-28:26 (2018) - Hantao Huang, Hang Xu, Yuehua Cai, Suleman Khalid Rai, Hao Yu:
Distributed Machine Learning on Smart-Gateway Network toward Real-Time Smart-Grid Energy Management with Behavior Cognition. ACM Trans. Design Autom. Electr. Syst. 23(5): 56:1-56:26 (2018) - Siam Umar Hussain, Farinaz Koushanfar:
P3: Privacy Preserving Positioning for Smart Automotive Systems. ACM Trans. Design Autom. Electr. Syst. 23(6): 79:1-79:19 (2018) - Siam Umar Hussain, M. Sadegh Riazi, Farinaz Koushanfar:
SHAIP: Secure Hamming Distance for Authentication of Intrinsic PUFs. ACM Trans. Design Autom. Electr. Syst. 23(6): 75:1-75:20 (2018) - Philipp Ittershagen, Kim Grüttner, Wolfgang Nebel:
An Integration Flow for Mixed-Critical Embedded Systems on a Flexible Time-Triggered Platform. ACM Trans. Design Autom. Electr. Syst. 23(4): 51:1-51:25 (2018) - Majid Jalili, Hamid Sarbazi-Azad:
Express Read in MLC Phase Change Memories. ACM Trans. Design Autom. Electr. Syst. 23(3): 33:1-33:24 (2018) - Munish Jassi, Yong Hu, Daniel Mueller-Gritschneder, Ulf Schlichtmann:
Graph-Grammar-Based IP-Integration (GRIP) - An EDA Tool for Software-Defined SoCs. ACM Trans. Design Autom. Electr. Syst. 23(3): 40:1-40:26 (2018) - Fengxian Jiao, Sheqin Dong:
Ordered Escape Routing with Consideration of Differential Pair and Blockage. ACM Trans. Design Autom. Electr. Syst. 23(4): 46:1-46:26 (2018) - Jaeyung Jun, Kyu Hyun Choi, Hokwon Kim, Sang Ho Yu, Seon Wook Kim, Youngsun Han:
Recovering from Biased Distribution of Faulty Cells in Memory by Reorganizing Replacement Regions through Universal Hashing. ACM Trans. Design Autom. Electr. Syst. 23(2): 16:1-16:21 (2018)
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