• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 76 matches

• 2000
• 
  Magdy S. Abadir, Sumit Dasgupta:
  Guest Editors' Introduction: Microprocessor Test and Verification. IEEE Des. Test Comput. 17(4): 4-5 (2000)
• 
  Chouki Aktouf, Hérvé Fleury, Chantal Robach:
  Inserting Scan at the Behavioral Level. IEEE Des. Test Comput. 17(3): 34-42 (2000)
• 
  Alberto Allara, Massimo Bombana, William Fornaciari, Fabio Salice:
  A Case Study in Design Space Exploration: The Tosca Environment Applied to a Telecommunication Link Controller. IEEE Des. Test Comput. 17(2): 60-72 (2000)
• 
  Luis Basto:
  First Results of ITC'99 Benchmark Circuits. IEEE Des. Test Comput. 17(3): 54-59 (2000)
• 
  Kia Bazargan, Ryan Kastner, Majid Sarrafzadeh:
  Fast Template Placement for Reconfigurable Computing Systems. IEEE Des. Test Comput. 17(1): 68-83 (2000)
• 
  Luca Benini, Alberto Macii, Enrico Macii, Massimo Poncino:
  Increasing Energy Efficiency of Embedded Systems by Application-Specific Memory Hierarchy Generation. IEEE Des. Test Comput. 17(2): 74-85 (2000)
• 
  Mauro Bertacchi, Alessandro De Gloria, Daniele Grosso, Mauro Olivieri:
  Semicustom Design of an IEEE 1394-Compliant Reusable IC Core. IEEE Des. Test Comput. 17(3): 95-105 (2000)
• 
  Dilip K. Bhavsar:
  Synchronizing the IEEE 1149.1 Test Access Port for Chip-Level Testability. IEEE Des. Test Comput. 17(2): 94-99 (2000)
• 
  Franc Brglez:
  The Scientific Method and Design and Test. IEEE Des. Test Comput. 17(3): 142-144 (2000)
• 
  David Van Campenhout, Trevor N. Mudge, John P. Hayes:
  Collection and Analysis of Microprocessor Design Errors. IEEE Des. Test Comput. 17(4): 51-60 (2000)
• 
  Rolf Clauberg, Peter Buchmann, Andreas Herkersdorf, David J. Webb:
  Design Methodology for a Large Communication Chip. IEEE Des. Test Comput. 17(3): 86-94 (2000)
• 
  Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero:
  RT-Level ITC'99 Benchmarks and First ATPG Results. IEEE Des. Test Comput. 17(3): 44-53 (2000)
• 
  Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran:
  Test Development for a Third-Version ColdFire Microprocessor. IEEE Des. Test Comput. 17(4): 29-37 (2000)
• 
  Scott Davidson:
  Twenty Years Ago Today. IEEE Des. Test Comput. 17(1): 111-112 (2000)
• 
  Scott Davidson:
  Testing in 2100. IEEE Des. Test Comput. 17(4): 119-120 (2000)
• 
  Scott Davidson, Justin E. Harlow III:
  Guest Editors' Introduction: Benchmarking for Design and Test. IEEE Des. Test Comput. 17(3): 12-14 (2000)
• 
  Sujit Dey, Debashis Panigrahi, Li Chen, Clark N. Taylor, Krishna Sekar, Pablo Sanchez:
  Using a Soft Core in a SoC Design: Experiences with picoJava. IEEE Des. Test Comput. 17(3): 60-71 (2000)
• 
  Michael Eisenring, Lothar Thiele, Eckart Zitzler:
  Conflicting Criteria in Embedded System Design. IEEE Des. Test Comput. 17(2): 51-59 (2000)
• 
  Patrick P. Gelsinger:
  Discontinuities Driven by a Billion Connected Machines. IEEE Des. Test Comput. 17(1): 7-15 (2000)
• 
  Giulio Gorla, Eduard Moser, Wolfgang Nebel, Eugenio Villar:
  System Specification Experiments on a Common Benchmark. IEEE Des. Test Comput. 17(3): 22-32 (2000)
• 
  Justin E. Harlow III:
  Overview of Popular Benchmark Sets. IEEE Des. Test Comput. 17(3): 15-17 (2000)
• 
  Brad L. Hutchings, Brent E. Nelson, Michael J. Wirthlin:
  Designing and Debugging Custom Computing Applications. IEEE Des. Test Comput. 17(1): 20-28 (2000)
• 
  Seung H. Hwang, Gwan S. Choi:
  A Reliability Testing Environment for Off-the-Shelf Memory Subsystems. IEEE Des. Test Comput. 17(3): 116-124 (2000)
• 
  Margarida F. Jacome, Gustavo de Veciana:
  Design Challenges for New Application-Specific Processors. IEEE Des. Test Comput. 17(2): 40-50 (2000)
• 
  Axel Jantsch, Shashi Kumar, Ahmed Hemani:
  A Metamodel for Studying Concepts in Electronic System Design. IEEE Des. Test Comput. 17(3): 78-85 (2000)
• 
  Keith A. Jenkins, James P. Eckhardt:
  Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops. IEEE Des. Test Comput. 17(2): 86-93 (2000)
• 
  Rohit Kapur, Cy Hay, Thomas W. Williams:
  The Mutating Metric for Benchmarking Test. IEEE Des. Test Comput. 17(3): 18-21 (2000)
• 
  Nektarios Kranitis, Dimitris Gizopoulos, Antonis M. Paschalis, Mihalis Psarakis, Yervant Zorian:
  Power-/Energy Efficient BIST Schemes for Processor Data Paths. IEEE Des. Test Comput. 17(4): 15-28 (2000)
• 
  Narayanan Krishnamurthy, Andrew K. Martin, Magdy S. Abadir, Jacob A. Abraham:
  Validating PowerPC Microprocessor Custom Memories. IEEE Des. Test Comput. 17(4): 61-76 (2000)
• 
  Fadi J. Kurdahi, Nader Bagherzadeh, Peter Athanas, Jose L. Muñoz:
  Guest Editors' Introduction: Configurable Computing. IEEE Des. Test Comput. 17(1): 17-19 (2000)

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