"On effective IDDQ testing of low-voltage CMOS circuits using ..."

Zhanping Chen, Liqiong Wei, Kaushik Roy (2001)

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DOI: 10.1109/92.953504

access: closed

type: Journal Article

metadata version: 2020-03-11

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Zhanping Chen, Liqiong Wei, Kaushik Roy:
On effective I_DDQ testing of low-voltage CMOS circuits using leakage control techniques. IEEE Trans. Very Large Scale Integr. Syst. 9(5): 718-725 (2001)

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