"Signal Integrity Improvements of a MEMS Probe Card Using Back-Drilling and ..."

Dong-Yeop Kim et al. (2011)

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DOI: 10.1109/TIM.2009.2036343

access: closed

type: Journal Article

metadata version: 2020-06-08

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Dong-Yeop Kim, Jindo Byun, Sang-Hoon Lee, Se-Jang Oh, Ki-Sang Kang, Hai-Young Lee:
Signal Integrity Improvements of a MEMS Probe Card Using Back-Drilling and Equalizing Techniques. IEEE Trans. Instrum. Meas. 60(3): 872-879 (2011)

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