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Ki-Sang Kang

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2010 – 2019

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2011
[j1]
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  - journals/tim/KimBLOKL11
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  - https://dblp.org/rec/journals/tim/KimBLOKL11
Dong-Yeop Kim, Jindo Byun, Sang-Hoon Lee, Se-Jang Oh, Ki-Sang Kang, Hai-Young Lee:
Signal Integrity Improvements of a MEMS Probe Card Using Back-Drilling and Equalizing Techniques. IEEE Trans. Instrum. Meas. 60(3): 872-879 (2011)

2000 – 2009

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2008
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Gyu-Yeol Kim, Eon-Jo Byunb, Ki-Sang Kang, Young-Hyun Jun, Bai-Sun Kong:
Wafer-Level Characterization of Probecards using NAC Probing. ITC 2008: 1-9

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