"Determination of the ESD Failure Cause Through its Signature."

M. Zecri et al. (2003)

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DOI: 10.1016/S0026-2714(03)00283-X

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type: Journal Article

metadata version: 2022-07-05

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M. Zecri, P. Besse, Philippe Givelin, M. Nayrolles, Marise Bafleur, Nicolas Nolhier:
Determination of the ESD Failure Cause Through its Signature. Microelectron. Reliab. 43(9-11): 1551-1556 (2003)

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