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M. Nayrolles

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2003
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M. Zecri, P. Besse, Philippe Givelin, M. Nayrolles, Marise Bafleur, Nicolas Nolhier:
Determination of the ESD Failure Cause Through its Signature. Microelectron. Reliab. 43(9-11): 1551-1556 (2003)

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