"Hot-carrier reliability and breakdown characteristics of multi-finger RF ..."

Hei Wong et al. (2009)

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DOI: 10.1016/J.MICROREL.2008.10.011

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type: Journal Article

metadata version: 2020-02-22

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Hei Wong, Y. Fu, Juin J. Liou, Y. Yue:
Hot-carrier reliability and breakdown characteristics of multi-finger RF MOS transistors. Microelectron. Reliab. 49(1): 13-16 (2009)

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