"Failure analysis of ESD-stressed SiC MESFET."

Tanguy Phulpin et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.121

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type: Journal Article

metadata version: 2023-09-30

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Tanguy Phulpin, David Trémouilles, Karine Isoird, Dominique Tournier, Philippe Godignon, Patrick Austin:
Failure analysis of ESD-stressed SiC MESFET. Microelectron. Reliab. 55(9-10): 1542-1548 (2015)

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