"Analysis of an ESD failure mechanism on a SiC MESFET."

Tanguy Phulpin et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.134

access: closed

type: Journal Article

metadata version: 2023-09-30

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Tanguy Phulpin, David Trémouilles, Karine Isoird, Dominique Tournier, Philippe Godignon, Patrick Austin:
Analysis of an ESD failure mechanism on a SiC MESFET. Microelectron. Reliab. 54(9-10): 2217-2221 (2014)

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