"Built-in self-test for bias temperature instability, hot-carrier ..."

Dae Hyun Kim, Soonyoung Cha, Linda S. Milor (2015)

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DOI: 10.1016/J.MICROREL.2015.06.077

access: closed

type: Journal Article

metadata version: 2022-01-06

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Dae Hyun Kim, Soonyoung Cha, Linda S. Milor:
Built-in self-test for bias temperature instability, hot-carrier injection, and gate oxide breakdown in embedded DRAMs. Microelectron. Reliab. 55(9-10): 2113-2118 (2015)

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