"Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs."

Fernanda Lima Kastensmidt et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.100

access: closed

type: Journal Article

metadata version: 2021-10-14

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Fernanda Lima Kastensmidt, Jorge L. Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost:
Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs. Microelectron. Reliab. 54(9-10): 2344-2348 (2014)

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