"A negative Vth cell architecture for highly scalable, ..."

Ken Takeuchi et al. (1999)

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DOI: 10.1109/4.760379

access: closed

type: Journal Article

metadata version: 2022-07-06

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Ken Takeuchi, Shinji Satoh, Tomoharu Tanaka, Ken-ichi Imamiya, Koji Sakui:
A negative V_th cell architecture for highly scalable, excellently noise-immune, and highly reliable NAND flash memories. IEEE J. Solid State Circuits 34(5): 675-684 (1999)

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