"A 55-ns 16-Mb DRAM with built-in self-test function using microprogram ROM."

Toshio Takeshima et al. (1990)

> Home

Details and statistics

DOI: 10.1109/4.58282

access: closed

type: Journal Article

metadata version: 2025-01-23

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jssc/TakeshimaTKWKMKTMNTYK90
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jssc/TakeshimaTKWKMKTMNTYK90
Toshio Takeshima, Masahide Takada, Hiroki Koike, Hiroshi Watanabe, Shigeru Koshimaru, Kenjiro Mitake, Wataru Kikuchi, Takaho Tanigawa, Tatsunori Murotani, Kenji Noda, Kazuhiro Tasaka, Koji Yamanaka, Kuniaki Koyama:
A 55-ns 16-Mb DRAM with built-in self-test function using microprogram ROM. IEEE J. Solid State Circuits 25(4): 903-911 (1990)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.