"SRAM for Error-Tolerant Applications With Dynamic Energy-Quality ..."

Fabio Frustaci et al. (2015)

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DOI: 10.1109/JSSC.2015.2408332

access: closed

type: Journal Article

metadata version: 2020-08-30

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Fabio Frustaci, Mahmood Khayatzadeh, David T. Blaauw, Dennis Sylvester, Massimo Alioto:
SRAM for Error-Tolerant Applications With Dynamic Energy-Quality Management in 28 nm CMOS. IEEE J. Solid State Circuits 50(5): 1310-1323 (2015)

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