"Sequential Test Decompressors with Fast Tester Bits Wide-Spreading."

Ondrej Novák, Jiri Jenícek, Martin Rozkovec (2017)

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DOI: 10.1142/S0218126617400011

access: closed

type: Journal Article

metadata version: 2024-10-06

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Ondrej Novák, Jiri Jenícek, Martin Rozkovec:
Sequential Test Decompressors with Fast Tester Bits Wide-Spreading. J. Circuits Syst. Comput. 26(8): 1740001:1-1740001:16 (2017)

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