"Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with ..."

Kentaroh Katoh, Kazuteru Namba, Hideo Ito (2008)

> Home

Details and statistics

DOI: 10.2197/IPSJTSLDM.1.91

access: closed

type: Journal Article

metadata version: 2020-09-29

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ipsj/KatohNI08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ipsj/KatohNI08
Kentaroh Katoh, Kazuteru Namba, Hideo Ito:
Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with Delay Fault Testability. IPSJ Trans. Syst. LSI Des. Methodol. 1: 91-103 (2008)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.