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"Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with ..."
Kentaroh Katoh, Kazuteru Namba, Hideo Ito (2008)
- Kentaroh Katoh, Kazuteru Namba, Hideo Ito:
Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with Delay Fault Testability. IPSJ Trans. Syst. LSI Des. Methodol. 1: 91-103 (2008)
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