"Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with ..."

Kentaroh Katoh, Kazuteru Namba, Hideo Ito (2008)

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DOI: 10.11185/IMT.3.704

access: closed

type: Journal Article

metadata version: 2024-08-28

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Kentaroh Katoh, Kazuteru Namba, Hideo Ito:
Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with Delay Fault Testability. Inf. Media Technol. 3(4): 704-716 (2008)

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