"A Built-in Reseeding Technique for LFSR-Based Test Pattern Generation."

Youhua Shi et al. (2003)

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DOI: —

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type: Journal Article

metadata version: 2021-06-08

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Youhua Shi, Zhe Zhang, Shinji Kimura, Masao Yanagisawa, Tatsuo Ohtsuki:
A Built-in Reseeding Technique for LFSR-Based Test Pattern Generation. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 86-A(12): 3056-3062 (2003)

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