"Test Consideration for Nanometer-Scale CMOS Circuits."

Kaushik Roy, T. M. Mak, Kwang-Ting (Tim) Cheng (2006)

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DOI: 10.1109/MDT.2006.52

access: closed

type: Journal Article

metadata version: 2022-12-07

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Kaushik Roy, T. M. Mak, Kwang-Ting (Tim) Cheng:
Test Consideration for Nanometer-Scale CMOS Circuits. IEEE Des. Test Comput. 23(2): 128-136 (2006)

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