"Minimizing Pattern Count for Interconnect Test under a Ground Bounce ..."

Erik Jan Marinissen et al. (2003)

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DOI: 10.1109/MDT.2003.1188257

access: closed

type: Journal Article

metadata version: 2024-02-05

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Erik Jan Marinissen, Bart Vermeulen, Henk D. L. Hollmann, Ben Bennetts:
Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint. IEEE Des. Test Comput. 20(2): 8-18 (2003)

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