"Built in self test: a complete test solution for telecommunication systems."

Nilanjan Mukherjee, Tapan J. Chakraborty, Ramesh Karri (1999)

> Home

Details and statistics

DOI: 10.1109/35.769277

access: closed

type: Journal Article

metadata version: 2020-08-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/cm/MukherjeeCK99
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/cm/MukherjeeCK99
Nilanjan Mukherjee, Tapan J. Chakraborty, Ramesh Karri:
Built in self test: a complete test solution for telecommunication systems. IEEE Commun. Mag. 37(6): 72-78 (1999)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.