"Analysis of the die test optimization algorithm for negative binomial ..."

C. Mani Krishna, Adit D. Singh (1992)

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DOI: 10.1109/VTEST.1992.232745

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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C. Mani Krishna, Adit D. Singh:
Analysis of the die test optimization algorithm for negative binomial yield statistics. VTS 1992: 176-181

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