"Test pattern generation system for delay faults using a high speed ..."

Yukiko Izuta, Fumiyasu Hirose (1992)

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DOI: 10.1109/VTEST.1992.232717

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yukiko Izuta, Fumiyasu Hirose:
Test pattern generation system for delay faults using a high speed simulation processor 'SP'. VTS 1992: 13-18

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