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"Test Time and Area Optimized BrST Scheme for Automotive ICs."
Nilanjan Mukherjee et al. (2019)
- Nilanjan Mukherjee, Jerzy Tyszer, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki:
Test Time and Area Optimized BrST Scheme for Automotive ICs. ITC 2019: 1-10

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