"Fault Modeling and Testing of Memristor-Based Spiking Neural Networks."

Kuan-Wei Hou et al. (2022)

> Home

Details and statistics

DOI: 10.1109/ITC50671.2022.00016

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/itc/HouCTWL22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/HouCTWL22
Kuan-Wei Hou, Hsueh-Hung Cheng, Chi Tung, Cheng-Wen Wu, Juin-Ming Lu:
Fault Modeling and Testing of Memristor-Based Spiking Neural Networks. ITC 2022: 92-99

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.