"A Low-Overhead Design for Testability and Test Generation Technique for ..."

Indradeep Ghosh, Niraj K. Jha, Sujit Dey (1997)

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DOI: 10.1109/TEST.1997.639593

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Indradeep Ghosh, Niraj K. Jha, Sujit Dey:
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems. ITC 1997: 50-59

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