"Voltage Noise Induced DRAM Soft Error Reduction Technique for 3D-CPUs."

Tiantao Lu et al. (2016)

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DOI: 10.1145/2934583.2934589

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-17

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Tiantao Lu, Caleb Serafy, Zhiyuan Yang, Ankur Srivastava:
Voltage Noise Induced DRAM Soft Error Reduction Technique for 3D-CPUs. ISLPED 2016: 82-87

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