"Bias Temperature Instability on SiC n- and p-MOSFETs for High Temperature ..."

Emran K. Ashik et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764565

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Emran K. Ashik, Sundar Babu Isukapati, Hua Zhang, Tianshi Liu, Utsav Gupta, Adam J. Morgan, Veena Misra, Woongje Sung, Ayman A. Fayed, Anant K. Agarwal, Bongmook Lee:
Bias Temperature Instability on SiC n- and p-MOSFETs for High Temperature CMOS Applications. IRPS 2022: 3

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