"Electrical performance stability characterization of high-sensitivity ..."

Lei Shi et al. (2012)

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DOI: 10.1109/IECON.2012.6389260

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-18

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Lei Shi, Stoyan N. Nihtianov, Frank Scholze, Lis K. Nanver:
Electrical performance stability characterization of high-sensitivity Si-based EUV photodiodes in a harsh industrial application. IECON 2012: 3952-3957

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