"Efficiency analysis of importance sampling in deep submicron STT-RAM ..."

Taehui Na et al. (2015)

> Home

Details and statistics

DOI: 10.1109/ICECS.2015.7440333

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-29

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icecsys/NaJJKK15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icecsys/NaJJKK15
Taehui Na, Hanwool Jeong, Seong-Ook Jung, Jung Pill Kim, Seung-Hyuk Kang:
Efficiency analysis of importance sampling in deep submicron STT-RAM design using uncontrollable industry-compatible model parameter. ICECS 2015: 400-403

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.