"A fault model for function and delay testing."

Joonhwan Yi, John P. Hayes (2001)

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DOI: 10.1109/ETW.2001.946657

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Joonhwan Yi, John P. Hayes:
A fault model for function and delay testing. ETW 2001: 27-34

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