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"Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable ..."
Kentaroh Katoh, Hideo Ito (2006)
- Kentaroh Katoh, Hideo Ito:
Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices. ETS 2006: 69-74
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