"Aging and voltage scaling impacts under neutron-induced soft error rate in ..."

Fernanda Lima Kastensmidt et al. (2014)

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DOI: 10.1109/ETS.2014.6847845

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Fernanda Lima Kastensmidt, Jorge L. Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost:
Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs. ETS 2014: 1-2

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