"A New LFSR with D and T Flip-Flops as an Effective Test Pattern Generator ..."

Tomasz Garbolino, Andrzej Hlawiczka (1999)

> Home

Details and statistics

DOI: 10.1007/3-540-48254-7_22

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/edcc/GarbolinoH99
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/edcc/GarbolinoH99
Tomasz Garbolino, Andrzej Hlawiczka:
A New LFSR with D and T Flip-Flops as an Effective Test Pattern Generator for VLSI Circuits. EDCC 1999: 321-338

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.