"Low-Cost IP Core Test Using Multiple-Mode Loading Scan Chain and Scan ..."

Gang Zeng et al. (2006)

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DOI: 10.1109/DFT.2006.41

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Gang Zeng, Youhua Shi, Toshinori Takabatake, Masao Yanagisawa, Hideo Ito:
Low-Cost IP Core Test Using Multiple-Mode Loading Scan Chain and Scan Chain Clusters. DFT 2006: 136-144

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