"Characterization and Estimation of Circuit Reliability Degradation under ..."

Kunhyuk Kang et al. (2007)

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DOI: 10.1145/1278480.1278572

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Kunhyuk Kang, Keejong Kim, Ahmad E. Islam, Muhammad Ashraful Alam, Kaushik Roy:
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement. DAC 2007: 358-363

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