"Statistical timing for parametric yield prediction of digital integrated ..."

Jochen A. G. Jess et al. (2003)

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DOI: 10.1145/775832.776066

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Jochen A. G. Jess, Kerim Kalafala, Srinath R. Naidu, Ralph H. J. M. Otten, Chandramouli Visweswariah:
Statistical timing for parametric yield prediction of digital integrated circuits. DAC 2003: 932-937

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