"Built-In Self-Test Circuit Optimization for Embedded Cores."

Srinivasa Vemuru, Sravani Kristem, Mohammed Y. Niamat (2010)

Details and statistics

DOI:

access: unavailable

type: Conference or Workshop Paper

metadata version: 2010-12-06

a service of  Schloss Dagstuhl - Leibniz Center for Informatics