"Invalid State Identification for Sequential Circuit Test Generation."

Hsing-Chung Liang, Chung-Len Lee, Jwu E. Chen (1996)

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DOI: 10.1109/ATS.1996.555128

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hsing-Chung Liang, Chung-Len Lee, Jwu E. Chen:
Invalid State Identification for Sequential Circuit Test Generation. Asian Test Symposium 1996: 10-15

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