"On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part ..."

Jennifer Dworak et al. (2000)

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DOI: 10.1109/ATS.2000.893618

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Jennifer Dworak, Michael R. Grimaila, Brad Cobb, Ting-Chi Wang, Li-C. Wang, M. Ray Mercer:
On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction. Asian Test Symposium 2000: 151-

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