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ORCIDDean G. Jarrett
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Journal Articles
- 2023
[j17]Dean G. Jarrett
, Ching-Chen Yeh, Shamith U. Payagala, Alireza R. Panna, Yanfei Yang, Linli Meng, Swapnil M. Mhatre, Ngoc Thanh Mai Tran, Heather M. Hill, Dipanjan Saha, Randolph E. Elmquist, David B. Newell, Albert F. Rigosi:
Graphene-Based Star-Mesh Resistance Networks. IEEE Trans. Instrum. Meas. 72: 1-10 (2023)- 2022
- [j16]Mona Feige, Stephan Schlamminger, Andrew D. Koffman, Dean G. Jarrett, Shamith U. Payagala, Alireza R. Panna, Bryan C. Waltrip, Mike Berilla, Frank Seifert, Yicheng Wang:
Comparison of a 100-pF Capacitor With a 12 906-Ω Resistor Using a Digital Impedance Bridge. IEEE Trans. Instrum. Meas. 71: 1-7 (2022) - 2020
- [j15]Takehiko Oe, Albert F. Rigosi, Mattias Kruskopf, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Randolph E. Elmquist, Nobu-hisa Kaneko, Dean G. Jarrett:
Comparison Between NIST Graphene and AIST GaAs Quantized Hall Devices. IEEE Trans. Instrum. Meas. 69(6): 3103-3108 (2020) - [j14]Kwang Min Yu, Dean G. Jarrett, Albert F. Rigosi, Shamith U. Payagala, Marlin Kraft:
Comparison of Multiple Methods for Obtaining P $\Omega$ Resistances With Low Uncertainties. IEEE Trans. Instrum. Meas. 69(6): 3729-3738 (2020) - [j13]Kwang Min Yu, Dean G. Jarrett, Andrew D. Koffman, Albert F. Rigosi, Shamith U. Payagala, Kwon Sang Ryu, Jeon Hong Kang, Sang Hwa Lee:
Using a Natural Ratio to Compare DC and AC Resistances. IEEE Trans. Instrum. Meas. 69(8): 5614-5619 (2020) - [j12]Shamith U. Payagala, Albert F. Rigosi, Alireza R. Panna, Alessio Pollarolo, Mattias Kruskopf, Stephan Schlamminger, Dean G. Jarrett, Ryan Brown, Randolph E. Elmquist, Duane Brown, David B. Newell:
Comparison Between Graphene and GaAs Quantized Hall Devices With a Dual Probe. IEEE Trans. Instrum. Meas. 69(12): 9374-9380 (2020) - 2019
- [j11]Stephan Schlamminger, Patrick Abbott, Zeina Kubarych, Dean G. Jarrett, Randolph E. Elmquist:
The units for mass, voltage, resistance, and electrical current in the SI. IEEE Instrum. Meas. Mag. 22(3): 9-16 (2019) - [j10]Albert F. Rigosi, Alireza R. Panna, Shamith U. Payagala, Mattias Kruskopf, Marlin Kraft, George R. Jones, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Jiuning Hu, Dean G. Jarrett, David B. Newell, Randolph E. Elmquist:
Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards. IEEE Trans. Instrum. Meas. 68(6): 1870-1878 (2019) - 2013
- [j9]Dean G. Jarrett:
Report to TIM Editor on CPEM 2012. IEEE Trans. Instrum. Meas. 62(6): 1396 (2013) - 2009
- [j8]Dean G. Jarrett, Randolph E. Elmquist, Nien Fan Zhang, Alejandra Tonina, Marta Porfiri, Janice de Brito Fernandes, Helio Schechter, Daniel Izquierdo, Carlos Faverio, Daniel Slomovitz, David Inglis, Kai Wendler, Felipe Hernandez Marquez, Benjamín Rodríguez Medina:
SIM Comparison of DC Resistance Standards at 1Ω, 1MΩ, and 1GΩ. IEEE Trans. Instrum. Meas. 58(4): 1188-1195 (2009) - 2005
- [j7]Randolph E. Elmquist, Emmanouel Hourdakis, Dean G. Jarrett, Neil M. Zimmerman:
Direct resistance comparisons from the QHR to100 MΩ using a cryogenic current comparator. IEEE Trans. Instrum. Meas. 54(2): 525-528 (2005) - 2003
- [j6]Dean G. Jarrett, Ronald F. Dziuba:
CCEM-K2 key comparison of 10-MΩ and 1-GΩ resistance standards. IEEE Trans. Instrum. Meas. 52(2): 474-477 (2003) - [j5]Nien Fan Zhang, Nell Sedransk, Dean G. Jarrett:
Statistical uncertainty analysis of key comparison CCEM-K2. IEEE Trans. Instrum. Meas. 52(2): 491-494 (2003) - 2001
- [j4]Dean G. Jarrett:
Analysis of a dual-balance high-resistance bridge at 10 TΩ. IEEE Trans. Instrum. Meas. 50(2): 249-254 (2001) - [j3]Randolph E. Elmquist, Anne-Marie Jeffery, Dean G. Jarrett:
Characterization of four-terminal-pair resistance standards: a comparison of measurements and theory. IEEE Trans. Instrum. Meas. 50(2): 267-271 (2001) - 1999
- [j2]Dean G. Jarrett:
Evaluation of guarded high-resistance Hamon transfer standards. IEEE Trans. Instrum. Meas. 48(2): 324-328 (1999) - [j1]Ronald F. Dziuba, Dean G. Jarrett, Lisa L. Scott, Andrew J. Secula:
Fabrication of high-value standard resistors. IEEE Trans. Instrum. Meas. 48(2): 333-337 (1999)
Coauthor Index
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