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ORCIDNobu-hisa Kaneko
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2020 – today
- 2023
[j36]Yasutaka Amagai
, Kenjiro Okawa, Norihiko Sakamoto, Nobu-hisa Kaneko:
Signal-to-Noise Ratio Optimization for Planar Multijunction Thermal Converters. IEEE Trans. Instrum. Meas. 72: 1-7 (2023)- [j35]Daiki Matsumaru, Shuji Nakamura, Michitaka Maruyama, Nobu-hisa Kaneko:
Stable Voltage Generation With a Josephson Voltage Standard Device Cooled at a 4 K Stage in a Dilution Refrigerator. IEEE Trans. Instrum. Meas. 72: 1-6 (2023) - [j34]Shuji Nakamura, Daiki Matsumaru, Gento Yamahata, Takehiko Oe, Yuma Okazaki, Shintaro Takada, Michitaka Maruyama, Akira Fujiwara, Nobu-hisa Kaneko:
Cryogenic Operation of Electromechanical Relay for Reversal of Quantized Current Generated by a Single-Electron Pump. IEEE Trans. Instrum. Meas. 72: 1-9 (2023) - 2022
- [j33]Vladimir Bubanja, Yasutaka Amagai, Kenjiro Okawa, Nobu-hisa Kaneko:
Mathematical Modeling and Measurement of Low Frequency Characteristics of Single-Junction Thermal Converters. IEEE Trans. Instrum. Meas. 71: 1-4 (2022) - [j32]Yuma Okazaki, Takahiro Tanaka, Norio Saito, Nobu-hisa Kaneko:
Subfemtoampere Resolved Ionization Current Measurements Using a High-Resistance Transimpedance Amplifier. IEEE Trans. Instrum. Meas. 71: 1-8 (2022) - 2021
- [j31]Yasutaka Amagai, Stefan Cular, Joseph A. Hagmann, Thomas E. Lipe, Nobu-hisa Kaneko:
Low-Frequency Characteristics of Silicon-Based High-Current Multijunction Thermal Current Converters Fabricated by Wet Chemical Etching. IEEE Trans. Instrum. Meas. 70: 1-7 (2021) - 2020
- [j30]Takehiko Oe, Albert F. Rigosi, Mattias Kruskopf, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Randolph E. Elmquist, Nobu-hisa Kaneko, Dean G. Jarrett:
Comparison Between NIST Graphene and AIST GaAs Quantized Hall Devices. IEEE Trans. Instrum. Meas. 69(6): 3103-3108 (2020) - [j29]Chiharu Urano, Kazuaki Yamazawa, Nobu-hisa Kaneko:
Measurement of the Melting Point of Gallium Using a Johnson Noise Thermometer. IEEE Trans. Instrum. Meas. 69(6): 3698-3703 (2020)
2010 – 2019
- 2019
- [j28]Yasutaka Amagai, Hiroyuki Fujiki, Kenjiro Okawa, Nobu-hisa Kaneko:
Low-Frequency AC-DC Differences of a Series-Parallel Circuit of Thermal Converters. IEEE Trans. Instrum. Meas. 68(6): 1907-1912 (2019) - [j27]Takayuki Abe, Takehiko Oe, Masaya Kumagai, Matsuo Zama, Nobu-hisa Kaneko:
Characterization of $1~\mathrm{k}\Omega$ Metal-Foil Standard Resistors and Continuing Drift-Rate Evaluation of 1 $\Omega$ and $10~\Omega$ Standard Resistors. IEEE Trans. Instrum. Meas. 68(6): 2078-2083 (2019) - 2017
- [j26]Atsushi Domae, Takehiko Oe, Syogo Kiryu, Nobu-hisa Kaneko:
Experimental Demonstration of Current Dependence Evaluation of Voltage Divider Based on Quantized Hall Resistance Voltage Divider. IEEE Trans. Instrum. Meas. 66(6): 1237-1242 (2017) - [j25]Yasuhiro Fukuyama, Norihiko Sakamoto, Takaya Kondo, Masanori Onuma, Nobu-hisa Kaneko:
Study of Contact Resistance in Connectors With Physical Simulation Using Nanofabrication. IEEE Trans. Instrum. Meas. 66(6): 1248-1253 (2017) - [j24]Chiharu Urano, Takahiro Yamada, Masaaki Maezawa, Kazuaki Yamazawa, Nobu-hisa Kaneko:
Measuring the Boltzmann's Constant Using Superconducting Integrated Circuit. IEEE Trans. Instrum. Meas. 66(6): 1323-1328 (2017) - [j23]Takehiko Oe, Sucheta Gorwadkar, Taro Itatani, Nobu-hisa Kaneko:
Development of 1 MΩ Quantum Hall Array Resistance Standards. IEEE Trans. Instrum. Meas. 66(6): 1475-1481 (2017) - [j22]Nobu-hisa Kaneko, Takehiko Oe, Takayuki Abe, Masaya Kumagai, Matsuo Zama:
Development of 1~Ω and 10~Ω Metal-Foil Standard Resistors. IEEE Trans. Instrum. Meas. 66(6): 1482-1488 (2017) - [j21]Tetsuro Misawa, Yasuhiro Fukuyama, Yuma Okazaki, Shuji Nakamura, Nariaki Nasaka, Takao Sasagawa, Nobu-hisa Kaneko:
Preparation and Characterization of Sn-BSTS Topological Insulator for Universality Test of the Quantum Hall Effect. IEEE Trans. Instrum. Meas. 66(6): 1489-1495 (2017) - [j20]Takehiko Oe, Atsushi Domae, Norihiko Sakamoto, Nobu-hisa Kaneko:
Evaluation of Automatic Coaxial Mechanical Scanners for Precise Resistance and Capacitance Measurements. IEEE Trans. Instrum. Meas. 66(6): 1560-1565 (2017) - 2015
- [j19]Takehiko Oe, Chiharu Urano, Nobu-hisa Kaneko, Hiroshi Eisaki, Yoshiyuki Yoshida, Atsushi Yamamoto, Koshi Takenaka:
Antiperovskite Manganese Nitride Standard Resistor. IEEE Trans. Instrum. Meas. 64(6): 1446-1450 (2015) - [j18]Yasuhiro Fukuyama, Randolph E. Elmquist, Lung-I Huang, Yanfei Yang, Fan-Hung Liu, Nobu-hisa Kaneko:
Controlling the Fermi Level in a Single-Layer Graphene QHE Device for Resistance Standard. IEEE Trans. Instrum. Meas. 64(6): 1451-1454 (2015) - [j17]Atsushi Domae, Takayuki Abe, Masaya Kumagai, Matsuo Zama, Takehiko Oe, Nobu-hisa Kaneko:
Development and Evaluation of High-Stability Metal-Foil Resistor With a Resistance of 1 kΩ. IEEE Trans. Instrum. Meas. 64(6): 1490-1495 (2015) - [j16]Nobu-hisa Kaneko, Takehiko Oe, Wan-Seop Kim, Dong-Hun Chae, Randolph E. Elmquist, Marlin Kraft:
Transportation Effect and Basic Characteristics of Metal-Foil Resistors Examined in an International Trilateral Pilot Study. IEEE Trans. Instrum. Meas. 64(6): 1514-1519 (2015) - [j15]Yasutaka Amagai, Atsushi Yamamoto, Megumi Akoshima, Hiroyuki Fujiki, Nobu-hisa Kaneko:
AC/DC Transfer Technique for Measuring Thomson Coefficient: Toward Thermoelectric Metrology. IEEE Trans. Instrum. Meas. 64(6): 1576-1581 (2015) - [j14]Atsushi Domae, Norihiko Sakamoto, Syogo Kiryu, Nobu-hisa Kaneko:
Development of 7.75 Ratio Voltage Divider Toward a Precise Measurement of Decade Resistance Based on the AC Quantized Hall Resistance. IEEE Trans. Instrum. Meas. 64(6): 1588-1594 (2015) - [j13]Michitaka Maruyama, Akio Iwasa, Hirotake Yamamori, Shih-Fang Chen, Chiharu Urano, Nobu-hisa Kaneko:
Calibration System for Zener Voltage Standards Using a 10 V Programmable Josephson Voltage Standard at NMIJ. IEEE Trans. Instrum. Meas. 64(6): 1606-1612 (2015) - [j12]Michitaka Maruyama, Hikari Takahashi, Kenichi Katayama, Takahito Yonezawa, Takahiro Kanai, Akio Iwasa, Chiharu Urano, Shogo Kiryu, Nobu-hisa Kaneko:
Evaluation of Linearity Characteristics in Digital Voltmeters Using a PJVS System With a 10-K Cooler. IEEE Trans. Instrum. Meas. 64(6): 1613-1619 (2015) - [j11]Shuji Nakamura, Yuri A. Pashkin, Jaw-Shen Tsai, Nobu-hisa Kaneko:
Single-Electron Pumping by Parallel SINIS Turnstiles for Quantum Current Standard. IEEE Trans. Instrum. Meas. 64(6): 1696-1701 (2015) - [j10]Shih-Fang Chen, Yasutaka Amagai, Michitaka Maruyama, Nobu-hisa Kaneko:
Uncertainty Evaluation of a 10 V RMS Sampling Measurement System Using the AC Programmable Josephson Voltage Standard. IEEE Trans. Instrum. Meas. 64(12): 3308-3314 (2015) - 2013
- [j9]Takehiko Oe, Chiharu Urano, Motoyoshi Hadano, Atsushi Ozawa, Koshi Takenaka, Nobu-hisa Kaneko:
Optimization of Mn3Ag1-x CuxN Antiperovskite Compound Fabrication for Resistance Standard. IEEE Trans. Instrum. Meas. 62(6): 1450-1453 (2013) - [j8]Shinsuke Shimamoto, Yuichi Naitou, Yasuhiro Fukuyama, Shogo Kiryu, Nobu-hisa Kaneko:
Native Graphene Oxides at Graphene Edges. IEEE Trans. Instrum. Meas. 62(6): 1461-1466 (2013) - [j7]Nobu-hisa Kaneko, Atsushi Domae, Takehiko Oe, Jürgen Schurr, Franz-Josef Ahlers, Shogo Kiryu:
First Attempt to Develop an On-Chip Double-Shielded QHR Device for Use in AC Measurements. IEEE Trans. Instrum. Meas. 62(6): 1743-1748 (2013) - [j6]Takehiko Oe, Kenjiro Matsuhiro, Taro Itatani, Sucheta Gorwadkar, Shogo Kiryu, Nobu-hisa Kaneko:
New Design of Quantized Hall Resistance Array Device. IEEE Trans. Instrum. Meas. 62(6): 1755-1759 (2013) - [j5]Atsushi Domae, Takehiko Oe, Masaya Kumagai, Matsuo Zama, Nobu-hisa Kaneko:
Characterization of 100-Ω Metal Foil Standard Resistors. IEEE Trans. Instrum. Meas. 62(6): 1776-1782 (2013) - 2011
- [j4]Nobu-hisa Kaneko, Michitaka Maruyama, Chiharu Urano:
Current Status of Josephson Arbitrary Waveform Synthesis at NMIJ/AIST. IEICE Trans. Electron. 94-C(3): 273-279 (2011) - [j3]Yasuhiko Sakamoto, Nobu-hisa Kaneko, Takehiko Oe, Masaya Kumagai, Matsuo Zama:
Novel 100-Omega Metal Foil Resistor. IEEE Trans. Instrum. Meas. 60(7): 2544-2549 (2011) - [j2]Takehiko Oe, Kenjiro Matsuhiro, Taro Itatani, Sucheta Gorwadkar, Shogo Kiryu, Nobu-hisa Kaneko:
Development of Quantum Hall Array Resistance Standards at NMIJ. IEEE Trans. Instrum. Meas. 60(7): 2590-2595 (2011)
2000 – 2009
- 2007
- [j1]Chiharu Urano, Nobu-hisa Kaneko, Masaaki Maezawa, Taro Itatani, Sucheta Gorwadkar, Hiroshi Saitou, J. Maeda, Shogo Kiryu:
Observation of Quantized Voltage Steps Using a Josephson Junction Array Driven by Optoelectronically Generated Pulses. IEEE Trans. Instrum. Meas. 56(2): 614-618 (2007)
Coauthor Index
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